The Image Search Engine for your Fab
Debugging root cause has never been easier
Powered by Vector Search
No two issues are exactly the same. Natively built on vector database allow accurate proximity match with lightning speed
Read-to-Go Embedding
model
Wafer Vector embedding models are pretrained on proprietary data for semiconductor applications so you can start to enjoy on day 1.
Default On-Prem
We value your data security over our convinience. This is why we are default on-prem. To make sure you have complete peace of mind
See How Vector Engine Can help you
Find Matching Wafers
Accurately gather impacted wafers at scale, no more escape.
Query: Find me the EDS maps has the similar EDS patterns from last 10 days
Results:
Left: Query sort map image
Right: Searched query sort map images
Cross Modality Search
Search impacted wafers from inline signatures.
Make better disposal review and faster to root cause
Query: Find me the defect map has matched sort patterns from scan step UX000001
Results:
Left : Query defect scan images
Right: Searched sort map images
Knowledge Retrieval
Quickly propagate best-known sources and knowledge through Retrieval Augmentation Generation(RAG)
Query: What are the existing known issues similar to this new sort pattern?
Results:
This pattern has been seen in excursion code: 0100 driven by high chamber PM. Advised to check PM life time for chambers at STEP:UX013343
Commonality on Vectors
Get real-time monitoring, no more forced commonality
Query: Is there any tool showing strong commonality to the identified patterns?
Results:
Patterns with similarity in run order to quickly get sense if a forced commonality occurs. No more manual lot collections
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